Work

Characterizing deep optical-sectioning microscopy performance with scattering phantoms and numerical simulations

Year: 2010

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.844315

Authors: Jonathan T. C. Liu, Michael J. Mandella, Gordon S. Kino, Christopher H. Contag

Institutions: Stanford Medicine, Stanford University

Language: English

Topic: Optical Imaging and Spectroscopy Techniques

Subfield: Radiology, Nuclear Medicine and Imaging

Field: Medicine

Domain: Health Sciences

Open Access status: closed

OpenAlex ID: W1976332903

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