Work

Non-invasive estimation of skin thickness from hyperspectral imaging and validation using echography

Year: 2014

Type: article

Source: Computers in Biology and Medicine

DOI: 10.1016/j.compbiomed.2014.12.010

Authors: Saurabh Vyas, Jon Meyerle, Philippe Burlina

Institutions: Johns Hopkins University, Johns Hopkins University Applied Physics Laboratory

Language: English

Topic: Optical Imaging and Spectroscopy Techniques

Subfield: Radiology, Nuclear Medicine and Imaging

Field: Medicine

Domain: Health Sciences

SDG: Good health and well-being

Open Access status: closed

OpenAlex ID: W1977028172

FWCI: 1.564

Cites: 18

Cited by: 29

Related to: 10