Work

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns

Year: 2010

Type: article

Source: Ultramicroscopy

DOI: 10.1016/j.ultramic.2010.08.001

Authors: T.B. Britton, C. Maurice, R. Fortunier, J.H. Driver, A.P. Day, G. Meaden, D.J. Dingley, K. Mingard, A.J. Wilkinson

Institutions: University of Oxford, Mines Saint-Étienne, University of Bristol, National Physical Laboratory

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Engineering and Physical Sciences Research Council

Awards: Platform Grant Support for Materials Characterisation at Oxford, G2421083613, Effective Structural Unit Size in Polycrystals: Formation, Quantification and Micromechanical Behaviour, G8589450745

OpenAlex ID: W1978092434

FWCI: 3.821

Cites: 39

Cited by: 141

Related to: 10