Work

Properties of Electrons in Semiconductor Inversion Layers with Many Occupied Electric Subbands. I. Screening and Impurity Scattering

Year: 1970

Type: article

Source: Physical review. B, Solid state

DOI: 10.1103/physrevb.2.1024

Authors: Eric D. Siggia, P. C. Kwok

Institution: IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Quantum and electron transport phenomena

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1978187707

FWCI: 3.013

Cites: 8

Cited by: 163

Related to: 10