The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory
Year: 2006
Type: article
Source: Expert Systems with Applications
Authors: Kun-Lin Hsieh, Lee-Ing Tong, Min-Chia Wang
Language: English
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W1978292895