Work

Electron microscopy of ultra-thin buried layers in InP and InGaAs

Year: 1993

Type: article

Source: Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties

DOI: 10.1080/01418619308219361

Authors: N. Grigorieff, D. Cherns, M. J. Yates, M. Hockly, S. D. Perrin, M. R. Aylett

Institutions: University of Bristol, BT Research

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W1979908952

FWCI: 1.849

Cites: 11

Cited by: 11

Related to: 10