Temperature dependence of 1/f noise mechanisms in silicon nanowire biochemical field effect transistors
Year: 2010
Type: article
Abstract: The 1∕f noise of silicon nanowire biochemical field effect transistors is fully characterized from weak to strong inversion in the temperature range 100-300 K. At 300 K, our devices follow the correlated Δn-Δμ model. As the temperature is lowered, the correlated mobility fluctuations become insignificant and the low frequency noise is best modeled by the Δn-model. For some devices, evidence of random telegraph signals is observed at low temperatures, indicating that fewer traps are active and that the 1∕f noise due to number fluctuations is further resolved to fewer fluctuators, resulting in a Lorentzian spectrum.
Source: Applied Physics Letters
DOI: 10.1063/1.3526382
Institution: Yale University
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W1980390912