Work

Applications of an amorphous silicon-based area detector for high-resolution, high-sensitivity and fast time-resolved pair distribution function measurements

Year: 2007

Type: article

Source: Journal of Applied Crystallography

DOI: 10.1107/s0021889807007856

Authors: Peter J. Chupas, Karena W. Chapman, Peter L. Lee

Institutions: Argonne National Laboratory, Advanced Photon Source

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1980686121

FWCI: 5.156

Cites: 24

Cited by: 223

Related to: 10