Work

Consistency and confidence: A dual metric for verifying 3D object detections in multiple LiDAR scans

Year: 2009

Type: conference-paper

Source: IEEE International Conference on Computer Vision Workshops

DOI: 10.1109/iccvw.2009.5457438

Authors: David L. Doria, Richard J. Radke

Institution: Rensselaer Polytechnic Institute

Language: English

Topic: Robotics and Sensor-Based Localization

Subfield: Aerospace Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1981020527

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Cites: 22

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Related to: 10