Work

Pushing the limits of SPM

Year: 2005

Type: article

Abstract: In the two decades since the invention of the scanning tunneling microscope (STM)1, the family of local probing techniques known as scanning probe microscopy (SPM) has come to full maturity. Nowadays, the quality with which nanoscale images can be obtained and local spectroscopic information acquired using these instruments is spectacular. In addition, the ease of use of these machines has improved so much that they have found their way into the laboratories, not just of physicists, but also chemists, biologists, and engineers.

Source: Materials Today

DOI: 10.1016/s1369-7021(05)00842-4

Authors: Joost W.M. Frenken, Tjerk H. Oosterkamp, Bas L.M. Hendriksen, Marcel J. Rost

Institution: Leiden University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $6,070

Funders: Strong, Stichting voor Fundamenteel Onderzoek der Materie, Universiteit Leiden, Nederlandse Organisatie voor Wetenschappelijk Onderzoek