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Using patent data for technology forecasting: China RFID patent analysis

Year: 2010

Type: article

Source: Advanced Engineering Informatics

DOI: 10.1016/j.aei.2010.05.007

Authors: Charles V. Trappey, Hsin-Ying Wu, Fataneh Taghaboni-Dutta, Amy J.C. Trappey

Institutions: National Taipei University of Technology, National Yang Ming Chiao Tung University, National Tsing Hua University, University of Illinois Urbana-Champaign

Language: English

Topic: Intellectual Property and Patents

Subfield: Management of Technology and Innovation

Field: Business, Management and Accounting

Domain: Social Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W1981373909

FWCI: 18.04

Cites: 37

Cited by: 189

Related to: 10