Work

Scanning Probe Microscopy: Electrical Scanning Probe Microscopy on Active Organic Electronic Devices (Adv. Mater. 1/2009)

Year: 2009

Type: article

Source: Advanced Materials

DOI: 10.1002/adma.200890111

Authors: Liam S. C. Pingree, Obadiah G. Reid, David S. Ginger

Institution: University of Washington

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1981850148

FWCI:

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