Exciton diffusion lengths of organic semiconductor thin films measured by spectrally resolved photoluminescence quenching
Year: 2009
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.3079797
Institutions: Princeton University, University of Michigan
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1982391368
