Work

Information And Artifact In Second-Order Statistics From Computed Tomography (CT) Images

Year: 1979

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.957149

Authors: Andre J. Duerinckx, Albert Macovski

Institutions: IBM Research - Thomas J. Watson Research Center, Stanford University

Language: English

Topic: Advanced X-ray and CT Imaging

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1983295089

FWCI:

Cites:

Cited by: 1

Related to: 10