Thermochemical description of dielectric breakdown in high dielectric constant materials
Year: 2003
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.1565180
Authors: J. McPherson, J-Y. Kim, A. Shanware, H. Mogul
Institution: Texas Instruments (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1983436117