Work

Charge-Fluctuation-Induced Dephasing of Exchange-Coupled Spin Qubits

Year: 2006

Type: article

Abstract: Exchange-coupled spin qubits in semiconductor nanostructures are shown to be vulnerable to dephasing caused by charge noise invariably present in the semiconductor environment. This decoherence of exchange gate by environmental charge fluctuations arises from the fundamental Coulombic nature of the Heisenberg coupling and presents a serious challenge to the scalability of the widely studied exchange gate solid state spin quantum computer architectures. We estimate dephasing times for coupled spin qubits in a wide range (from 1 ns up to >1 micros) depending on the exchange coupling strength and its sensitivity to charge fluctuations.

Source: Physical Review Letters

DOI: 10.1103/physrevlett.96.100501

Authors: Xuedong Hu, S. Das Sarma

Institutions: University at Buffalo, State University of New York, University of Maryland, College Park

Language: English

Topic: Quantum and electron transport phenomena

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

Funder: Army Research Office

OpenAlex ID: W1983497176

FWCI: 8.737

Cites: 29

Cited by: 190

Related to: 9