Schottky barrier height measurement by electron-beam induced voltage
Year: 1982
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.93326
Authors: H.-C. W. Huang, C. F. Aliotta, P. S. Ho
Institution: IBM Research - Thomas J. Watson Research Center
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1985287455