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A test sheet generating algorithm based on intelligent genetic algorithm and hierarchical planning

Year: 2012

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.966822

Authors: Peipei Gu, Zhendong Niu, Xuting Chen, Wei Chen

Institution: Beijing Institute of Technology

Language: English

Topic: Educational Technology and Assessment

Subfield: Information Systems

Field: Computer Science

Domain: Physical Sciences

SDG: Quality education

Open Access status: closed

OpenAlex ID: W1985308118

FWCI:

Cites:

Cited by: 2

Related to: 10