Work

A New Reliability Parameter for Automated Perimetry

Year: 1993
Type: article
Authors: Michael Lee, Mario Zulauf, Joseph Caprioli
Institution: Yale University
Language: English
Subfield: Ophthalmology
Field: Medicine
Open Access status: closed
OpenAlex ID: W1986152003
FWCI: 0.546
Cites:
Cited by: 1
Related to: 10