Work

Measurement of Wave Aberrations of Microscope and Other Objectives

Year: 1961

Type: article

Source: Journal of the Optical Society of America

DOI: 10.1364/josa.51.000158

Authors: M. De, M. K. Sen Gupta

Institutions: University of Calcutta, CSIR National Physical Laboratory of India

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1986384928

FWCI: 1.223

Cites: 3

Cited by: 5

Related to: 10