Work

Desorption/ionization on silicon (DIOS) mass spectrometry: background and applications

Year: 2003

Type: article

Source: International Journal of Mass Spectrometry

DOI: 10.1016/s1387-3806(02)00973-9

Authors: Warren G. Lewis, Zhouxin Shen, M.G. Finn, Gary Siuzdak

Institution: Scripps Research Institute

Language: English

Topic: Mass Spectrometry Techniques and Applications

Subfield: Spectroscopy

Field: Chemistry

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1986443470

FWCI: 7.647

Cites: 44

Cited by: 191

Related to: 10