Work

Applications of the upside-down normal loss function

Year: 1996

Type: article

Source: IEEE Transactions on Semiconductor Manufacturing

DOI: 10.1109/66.484295

Authors: D. Drain, A.M. Gough

Institution: Intel (United States)

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

Funder: University of Arizona

OpenAlex ID: W1986484484

FWCI:

Cites: 6

Cited by: 24

Related to: 10