Work

Scanning Force Microscope Studies of Detachment of Nanometer Adhering Particulates

Year: 1999

Type: article

Source: MRS Proceedings

DOI: 10.1557/proc-566-273

Authors: J. T. Dickinson, R. F. Hariadi, L. Scudiero, S. C. Langford

Institution: Washington State University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W1987220016

FWCI:

Cites: 9

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Related to: 10