Nondestructive elemental depth profiling of Japanese lacquerware ‘Tamamushi‐nuri’ by confocal 3D‐XRF analysis in comparison with micro GE‐XRF
Year: 2009
Type: article
Source: X-Ray Spectrometry
DOI: 10.1002/xrs.1163
Authors: Kazuhiko Nakano, Kouichi Tsuji
Institutions: Osaka City University, Japan Science and Technology Agency
Language: English
Subfield: Archeology
Field: Arts and Humanities
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W1987403675