Work

Comprehensive characterization of copper indium disulfide thin film

Year: 1999

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.367558

Authors: Richard Mu, Don O. Henderson, Akira Ueda, Marvin H. Wu, Johnathan Bennett, M. A. M. Paliza, M. B. Huang, J. Keay, Leonard C. Feldman, K. C. Kwiatkowski, C. M. Lukehart, Jennifer Hollingsworth, W. E. Buhro, J. Harris, E. Gordon, A. Hepp

Institutions: Fisk University, Vanderbilt University, University of Washington, Glenn Research Center

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Aeronautics and Space Administration

OpenAlex ID: W1987538967

FWCI:

Cites:

Cited by: 2

Related to: 10