Work

Electronic structure of silicide-silicon interfaces

Year: 1982

Type: article

Source: Thin Solid Films

DOI: 10.1016/0040-6090(82)90089-x

Authors: G.W. Rubloff, P.S. Ho

Institutions: IBM (United States), IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1987725489

FWCI: 3.332

Cites: 43

Cited by: 32

Related to: 10