Work

Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

Year: 1998

Type: article

Abstract: The development of two zone-plate microscopes for X-ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.

Source: Journal of Synchrotron Radiation

DOI: 10.1107/s0909049597014283

Authors: T. Warwick, H. Ade, S. Cerasari, J. Denlinger, K. Franck, A. Garcia, S. Hayakawa, A. Hitchcock, J. Kikuma, S. Klingler, J. Kortright, G. Morisson, M. Moronne, E. Rightor, E. Rotenberg,, S. Seal, H.-J. Shin, W. F. Steele, B. P. Tonner

Institutions: Lawrence Berkeley National Laboratory, University of California, Berkeley, North Carolina State University, University of Trieste, University of Michigan, The University of Tokyo, McMaster University, Asahi Chemical & Industry (Japan), Dow Chemical (United States), Pohang University of Science and Technology, Pohang Accelerator Laboratory, University of Wisconsin–Milwaukee

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W1989716869

FWCI: 3.602

Cites: 8

Cited by: 32

Related to: 10