Work

Intensity-Modulated Scanning Kelvin Probe Microscopy for Probing Recombination in Organic Photovoltaics

Year: 2014

Type: article

Source: ACS Nano

DOI: 10.1021/nn5045867

Authors: Guozheng Shao, Micah S. Glaz, Fei Ma, Huanxin Ju, David S. Ginger

Institutions: University of Washington, Lanzhou University, University of Science and Technology of China, National Synchrotron Radiation Laboratory

Language: English

Topic: Organic Electronics and Photovoltaics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: U.S. Department of Energy

Award: TAS::89 0227::TAS RECOVERY; RECOVERY ACT - CENTER FOR INTERFACE SCIENCE: HYBRID SOLAR-ELECTRIC MATERIALS (CIS:HSEM) -- EFRC; PI - NEAL ARMSTRONG

OpenAlex ID: W1990146502

FWCI: 5.136

Cites: 61

Cited by: 69

Related to: 10