Work

Reflected‐light differential‐interference microscopy: principles, use and image interpretation

Year: 1970

Type: article

Source: Journal of Microscopy

DOI: 10.1111/j.1365-2818.1970.tb02219.x

Authors: Robert Hoffman, Leo Gross

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1990505471

FWCI: 0.874

Cites: 14

Cited by: 38

Related to: 10