Work

Shortfalls of panel unit root testing

Year: 2003

Type: article

Source: Economics Letters

DOI: 10.1016/s0165-1765(03)00210-6

Authors: Jack Strauss, Taner Yigit

Institutions: Saint Louis University, Bilkent University

Language: English

Topic: Spatial and Panel Data Analysis

Subfield: Economics and Econometrics

Field: Economics, Econometrics and Finance

Domain: Social Sciences

Open Access status: green

OpenAlex ID: W1990843384

FWCI: 11.32

Cites: 7

Cited by: 128

Related to: 10