Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope
Year: 1990
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.103950
Authors: Gerhard Meyer, Nabil M. Amer
Institution: IBM Research - Thomas J. Watson Research Center
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1991169801