Work

High resolution surface morphology measurements using EBSD cross-correlation techniques and AFM

Year: 2011

Type: article

Source: Ultramicroscopy

DOI: 10.1016/j.ultramic.2011.01.039

Authors: M.D. Vaudin, G. Stan, Y.B. Gerbig, R.F. Cook

Institution: National Institute of Standards and Technology

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1991247882

FWCI: 2.378

Cites: 37

Cited by: 32

Related to: 10