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Wall loss reduction technique using an electrodynamic disturbance for airborne particle processing chip applications

Year: 2010

Type: article

Source: Journal of Micromechanics and Microengineering

DOI: 10.1088/0960-1317/20/3/035034

Authors: Min-gu Kim, Yong-Ho Kim, Hong-Lae Kim, Chul Woo Park, Yun-Haeng Joe, Jungho Hwang, Yong-Jun Kim

Institutions: Yonsei University, Samsung (South Korea), Samsung Electronics (South Korea)

Language: English

Topic: Aerosol Filtration and Electrostatic Precipitation

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1991403917

FWCI: 0.757

Cites: 26

Cited by: 11

Related to: 10