Ionic Transport Phenomena in Nanofluidics: Experimental and Theoretical Study of the Exclusion-Enrichment Effect on a Chip
Year: 2005
Type: article
Abstract: In nanometer-sized apertures with charged surfaces, the extension of the electrical double layer results in the electrostatic exclusion of co-ions and enrichment in counterions, which affects the permselectivity of such structures. A modeling of this phenomenon is proposed and is compared with quantitative measurements of the ionic permeability change of a Pyrex nanoslit at low ionic strength. The comparison of experimental results with theoretical predictions justifies that electrostatic forces are the governing forces in nanofluidics.
Source: Nano Letters
DOI: 10.1021/nl050265h
Authors: Adrien Plecis, Reto B. Schoch, Philippe Renaud
Institution: École Polytechnique Fédérale de Lausanne
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W1991642760