Year: 2007
Type: article
Abstract: Phase stability and thermoelectric properties of a layered structure of (ZnxCu2-x)V2O7 solid solution were studied at x ≥ 0.2. X-ray diffraction measurements, compositional studies and thermal analysis clarified that the low temperature form of (ZnxCu2-x)V2O7 solid solution (monoclinic structure, C2/c) was stable at 0.2 ≤ x ≤ 2 when annealed at 823 K in air. On heating, the phase transformation occurred at 0.2 ≤ x ≤ 2 at a nearly constant temperature around 873 K, above which a high temperature form of (ZnxCu2-x)V2O7 solid solution was formed.Seebeck coefficients of the low temperature form of (ZnxCu2-x)V2O7 solid solution showed the large negative value of about −520 to −700μV/K, and the electrical resistivity increased with Zn addition. Power factor was the maximum of 1.99 × 10−7 W/m K2 at 873K for the low temperature form of the (Zn0.2Cu1.8)V2O7 solid solution.
DOI: 10.2497/jjspm.54.356
Authors: Kotaro Sotojima, Ryosuke O. Suzuki, Koji Amezawa, Yoichi Tomii
Institutions: Kyoto University, Hokkaido University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W1991873988