Structural Characterization and Electron Tunneling at n-Si/SiO2/SAM/Liquid Interface
Year: 1999
Type: article
DOI: 10.1021/jp9838184
Authors: Y. Gu, B. Akhremitchev, G. C. Walker, D. H. Waldeck
Institution: University of Pittsburgh
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1991909035
