Work

Data mining for yield enhancement in TFT-LCD manufacturing: an empirical study

Year: 2010

Type: article

Source: Journal of the Chinese Institute of Industrial Engineers

DOI: 10.1080/10170660903541856

Authors: Chia-Yu Hsu, Chen-Fu Chien, Chen-Fu Chien, Kuo-Yi Lin, Chen-Yu Chien, Chen-Yu Chien

Institution: National Tsing Hua University

Language: English

Topic: Fault Detection and Control Systems

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Council

OpenAlex ID: W1992061061

FWCI: 2.119

Cites: 31

Cited by: 14

Related to: 10