Work

Plane-strain bulge test for nanocrystalline copper thin films

Year: 2007

Type: article

Source: Scripta Materialia

DOI: 10.1016/j.scriptamat.2007.05.012

Authors: Xiaoding Wei, Dongyun Lee, Sanghoon Shim, Xi Chen, Jeffrey W. Kysar

Institutions: Columbia University, Korea Institute of Science and Technology, Oak Ridge National Laboratory

Language: English

Topic: Microstructure and mechanical properties

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Science Foundation, Empire State Development's Division of Science, Technology and Innovation

Awards: Materials Research Science and Engineering Center: Center for Nanostructured Materials, Effects of Heterogeneity, Anisotropy and Length Scale Effects in Microscale Deformation Processes, SGER: Detailed Interaction of Dislocations and Grain Boundaries in Nanoscale Gold Bicrystals, Measurement of Mechanical Properties of Small Material Structures by Nanoindentation

OpenAlex ID: W1992183345

FWCI: 0.921

Cites: 41

Cited by: 35

Related to: 10