Year: 1976
Type: article
Abstract: Advances in thick film technology have progressed up to the present time along empirical lines motivated largely by economic factors, so at present we have a poor and inadequate understanding of the transport mechanism(s) in thick film resistors and conductors.Contributions to a better knowledge of these materials could be derived from the measurement of quantities other than those usually considered, which include temperature-dependence of resistivity and noise.
DOI: 10.1155/apec.3.181
Authors: M. Prudenziati, A. Cattaneo
Institution: University of Modena and Reggio Emilia
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
Estimated APC paid: $1,000
OpenAlex ID: W1992536187