Work

Examiner citations, applicant citations, and the private value of patents

Year: 2009

Type: article

Source: Economics Letters

DOI: 10.1016/j.econlet.2009.08.019

Authors: Deepak Hegde, Bhaven Sampat

Institutions: New York University, University of California, Berkeley, Columbia University

Language: English

Topic: Intellectual Property and Patents

Subfield: Management of Technology and Innovation

Field: Business, Management and Accounting

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W1992679964

FWCI: 14.88

Cites: 11

Cited by: 147

Related to: 10