Work

A silicon structure for electrical characterisation of nanoscale elements

Year: 2001

Type: article

Source: MRS Proceedings

DOI: 10.1557/proc-679-b2.3

Authors: P.J.A. Sazio, J. Berg, P. See, C.J.B. Ford, P. Lundgren, N.C. Greenham, D.S. Ginger, S. Bengtsson, S.N. Chin

Institutions: University of Cambridge, Chalmers University of Technology

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1992845591

FWCI: 0.837

Cites: 12

Cited by: 7

Related to: 10