Work

Lateral resolution enhancement in confocal self-interference microscopy

Year: 2005

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.589526

Authors: DongKyun Kang, DaeGab Gweon

Institution: Korea Advanced Institute of Science and Technology

Language: English

Topic: Digital Holography and Microscopy

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1993497152

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