Evidences of oxygen-mediated resistive-switching mechanism in TiN\HfO2\Pt cells
Year: 2010
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.3527086
Authors: L. Goux, P. Czarnecki, Y. Y. Chen, L. Pantisano, X. P. Wang, R. Degraeve, B. Govoreanu, M. Jurczak, D. J. Wouters, L. Altimime
Institution: IMEC
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1993662835