Work

Passive Polarimetric Imagery-Based Material Classification Robust to Illumination Source Position and Viewpoint

Year: 2010

Type: article

Source: IEEE Transactions on Image Processing

DOI: 10.1109/tip.2010.2052274

Authors: Thilakam Vimal Thilak Krishna, Charles D. Creusere, David G. Voelz

Institutions: Nvidia (United States), New Mexico State University

Language: English

Topic: Optical Polarization and Ellipsometry

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1994783528

FWCI: 0.364

Cites: 20

Cited by: 43

Related to: 10