Year: 2010
Type: article
Abstract: We have examined the interfacial thermal conductance GK of single and multilayer graphene samples prepared on fused SiO2 substrates by mechanical exfoliation of graphite. By using an ultrafast optical pump pulse and monitoring the transient reflectivity on the picosecond time scale, we obtained an average value of GK of GK=5000 W/cm2 K for the graphene/SiO2 interface at room temperature. We observed significant variation in GK between individual samples, but found no systematic dependence on the thickness of the graphene layers.
Source: Applied Physics Letters
DOI: 10.1063/1.3511537
Authors: Kin Fai Mak, Chun Hung Lui, Tony F. Heinz
Institution: Columbia University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W1996946432