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Correlation of 0.67um scatter with local stress in Ge impacted with the modified Cambridge liquid jet device

Year: 1994

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.187334

Authors: Michael Wilson, D. Price, Steve Strohecker

Language: English

Topic: Surface Roughness and Optical Measurements

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1997550928

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Cites: 2

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Related to: 10