An Accelerated Life Test Model Based on Reliability Kinetics
Year: 1995
Type: article
Source: Technometrics
Authors: William Q. Meeker, Michael J. LuValle
Institutions: Iowa State University, AT&T (United States)
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1998182348