On polynomial-time testable combinational circuits
Year: 1994
Type: article
Source: IEEE Transactions on Computers
DOI: 10.1109/12.324562
Authors: N.S.V. Rao, S. Toida
Institutions: Oak Ridge National Laboratory, Old Dominion University
Language: English
Subfield: Computational Theory and Mathematics
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2000280971