Continuous weak measurement of a trapped electron using a percolation field effect transistor
Year: 2013
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.4819382
Authors: S. Fleming, W. I. Milne, D. G. Hasko
Institutions: University of Cambridge, Kyung Hee University
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2000712910