A compact local binary pattern using maximization of mutual information for face analysis
Work
Year: 2010
Type: article
Source: Pattern Recognition
Authors Bongjin Jun, Taewan Kim, Daijin Kim
Institution Pohang University of Science and Technology
Cites: 43
Cited by: 48
Related to: 10
FWCI: 5.675
Citation percentile (by year/subfield): 93.36
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed